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Explore our latest research, application article, and technical insights on battery testing.
Why Is Coin Cell Specific Capacity Inconsistent? 7 Key Factors Affecting Specific Capacity Accuracy
📅 2026/04/27
Coin Cell Automatic Assembly System
Abstract Specific capacity in ...
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Analysis of the Correlation Between Mechanical Behavior and Aging Degradation in Lithium-Ion Batteries
📅 2026/04/23
In-Situ Cell Swelling
Abstract The relationship betw...
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Is Cycle Diving Caused by Single Particle Mechanical Failure? A Single Particle Crushing Strength Study on Ni-Rich NCM and Graphite
📅 2026/04/10
Single Particle Mechanics
1. Introduction As lithium-ion...
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Deconstructing Double-Layer Coating Graphite Anode: Organic Compound Physical Characterization by Layer
Abstract Double-layer (dual-la...
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Mechanical Property Evaluation of Porous Carbon and CVD Silicon‑Carbon at Single‑Particle and Powder Levels
1. Introduction Silicon stands...
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Synergistic Induction of P2/O3 Mixed Phase ByThermal Diffusion Regulation and High‑Entropy Strategy for High‑Performance Layered Cathodes
📅 2026/04/07
Academic Application
Single Particle Mechanics
1. Article Information Wenhao ...
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Assessing the Air Degradation Behavior of Sodium Layered Oxide Cathodes
1. Introduction As the new ene...
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Dynamic EIS Reveals Real-Time Battery Impedance Measurement During Charge and Discharge
📅 2026/03/30
Electrochemical Performance Analysis
Abstract Dynamic EIS (DEIS) is...
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International Battery Seminar 2026 | IEST Instruments Invites You to Booth 1022 in Orlando
📅 2026/03/23
Company News
IEST Instruments, a leading pr...
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Battery Japan 2026 | IEST Lights the Way with Advanced Battery Testing Innovations in Tokyo
📅 2026/03/18
Company News
IEST Instruments, a leading pr...
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InterBattery 2026 | IEST Instruments to Showcase Advanced Battery Testing Solutions in Seoul
📅 2026/03/11
Company News
IEST Instruments Successfully ...
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Pouch Cell DCR Testing: Component-Level Teardown Data for Direct Current Resistance
📅 2026/02/27
Electrode Characterization
Abstract Direct Current Resist...
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